ABSTRACT
Development of wheat varieties with high yield potential is the demand of present time. This improvement can be possible if there is significant genetic variability for yield attributing traits. In present experiment assessment of genetic variability was done on Research Area of Department of Genetics and Plant Breeding, CCS HAU, Hisar. For this study, 28 genotypes of four groups i.e. bread, durum and synthetic wheat and triticale were used. Morphological data for yield and attributing traits was recorded from randomly selected five plants per genotype and analyzed using statistical software R. Significant genetic variability was recorded for all the traits. Correlation analysis of these traits revealed that biological yield, thousand grain weight and harvest index were positively correlated with grain yield. Complexity of data was reduced by PCA which grouped the total parameters into three main PCs with eigenvalue greater than one and accounted about 75% of genetic variability. The divergence of genotypes was evaluated by using D2 matrices. Total eleven clusters were formed out of which cluster XI had maximum five genotypes. Most of triticale and synthetic wheat genotypes were clustered into separate group than bread and durum wheat. This variation of triticale and synthetic wheat can be utilized in wheat breeding programmes.